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長井 真一
長井 真一

Shinichi NAGAI

  • Of Counsel
  • Tokyo

News

Education

1991
University of Tokyo Graduate School of Engineering (M.E.)
1989
The University of Tokyo (B.E.)

Professional Experience

Chief Administrative Judge, the 4th Board of Appeal (Amusument), Appeals Department
Chief Administrative Judge, the 2nd Board of Appeal (Material Analysis), Appeals Department
Chief Administrative Judge, the 5th Board of Appeal (Natural Resources, Living Environment) , Appeals Department
Judicial Research Official, Supreme Court (Judicial Research Official, Intellectual Property High Court)
Chief Administrative Judge, the 3rd Board of Appeal (Amusement), Appeals Department
Director, Diagnosis and Analysis Division, the First Examination Department
Director, Material Analysis Division, the First Examination Department
Director, Measurement of Distance and Electricity Sub-Division, Measurement Division, the First Examination Department
Director, Nano Optics Sub-Division, Nano Physics Division, the First Examination Department
Senior Primary Examiner, Nano Physics Division, the First Examination Department
Primary Examiner, Medical Diagnosis Sub-Division, Material Analysis Division, the First Patent Examination Department
The fiscal year 2007 Temporary Member, Patent Attorneys Examining and Disciplinary Subcommittee (Patent and Utility Model Law)
The fiscal year 2006 Temporary Member, Patent Attorneys Examining and Disciplinary Subcommittee (Patent and Utility Model Law)
Administrative Judge, the 2nd Board of Appeal (Material Analysis), Appeals Department
Examination and Research Office, Administrative Affairs Division
Examiner, Measurement Division, the First Patent Examination Department
Deputy Director, Examination Standards Office, Administrative Affairs Division
Examiner, Measuremant of Electricity Sub-Division, Applied Physics Division, the Second Examination Department
Visiting Scholar, University of Washington School of Law
Assistant Director for International Organizations, International Affairs Division
Examiner, Applied Physics Division, the Second Examination Department
Asistant Examiner, Applied Physics Division, the Second Examination Department